By Giovanni Crupi, Dominique Schreurs
This groundbreaking e-book is the 1st to provide an advent to microwave de-embedding, displaying the way it is the cornerstone for waveform engineering. The authors of every bankruptcy truly clarify the theoretical thoughts, delivering a origin that helps linear and non-linear measurements, modelling and circuit layout. fresh advancements and destiny tendencies within the box are coated all through, together with profitable thoughts for low-noise and gear amplifier layout. This publication is a must have for these wishing to appreciate the total capability of the microwave de-embedding notion to accomplish profitable ends up in the parts of measurements, modelling, and layout at excessive frequencies.
With this publication you are going to learn:
- The theoretical historical past of high-frequency de-embedding for measurements, modelling, and design
- Details on utilising the de-embedding proposal to the transistor's linear, non-linear, and noise behaviour
- The effect of de-embedding on low-noise and gear amplifier design
- The fresh advances and destiny developments within the box of high-frequency de-embedding
- Presents the idea and perform of microwave de-embedding, from the fundamental ideas to contemporary advances and destiny trends
- Written through specialists within the box, all of whom are prime researchers within the area
- Each bankruptcy describes theoretical heritage and provides experimental effects and sensible applications
Read or Download Microwave De-embedding. From Theory to Applications PDF
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Additional info for Microwave De-embedding. From Theory to Applications
To de-embed properly, the data are a work of art that require knowledge and experience. This task becomes even more challenging by working at higher frequencies. Microwave de-embedding can be differentiated into two different cases depending on whether it is applied to linear or nonlinear data. 16 Illustration of the application of the de-embedding and embedding concepts to shift the input and output electrical reference planes from the whole to the actual device and vice versa for on-wafer characterization based on ground-signal-ground (GSG) probes.
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